2nd Annual Institute for Electronics and Nanotechnology User Science and Engineering Review Day and 10th Anniversary of 100 kV Electron Beam Lithography
The Georgia Tech Institute for Electronics and Nanotechnology (IEN) will be hosting its 2nd Annual User Science and Engineering Review (USER) Day on Thursday, June 26th, 2014 from 8:00 AM – 5:00 PM. This special event will provide an opportunity to learn about the latest research activities from academic and industry research organizations that use our shared-user laboratories. This year we will also commemorate the 10th Anniversary of the operation of the JEOL JBX-9300FS 100kV direct write Electron Beam Lithography System at Georgia Tech with dedicated oral and poster sessions on this topic.
We have an exciting program with two invited keynote presentations; one by Dr. George Yu, CEO / Founder, Variable Inc, Chattanooga, TN and the other by Dr. Leonidas E. Ocolam, a Physicist from Argonne National Laboratory. We also have 12 oral presentations and approximately 30 poster presentations from users of the IEN shared-user laboratories.
Registration is FREE but space is limited due to the size capacity of the Marcus Building conference room. The registration for the full-day program will include, in addition to the research presentations, a poster session, continental breakfast, and a boxed lunch. Registrations will be processed on a "first-come-first-serve" basis, so please register as soon as possible to secure your space.
Please visit IENUserDay2014.eventbrite.com to register.
For more information, please contact Paul Joseph at firstname.lastname@example.org or (404) 894-5029.