The Georgia Tech Institute for Electronics and Nanotechnology (IEN) will be hosting its 2nd Annual User Science and Engineering Review (USER) Day on Thursday, June 26th, 2014 from 8:00 AM – 5:00 PM. This special event will provide an opportunity to learn about the latest research activities from academic and industry research organizations that use our shared-user laboratories. This year we will also commemorate the 10th Anniversary of the operation of the JEOL JBX-9300FS 100kV direct write Electron Beam Lithography System at Georgia Tech with dedicated oral and poster sessions on this topic.
We have an exciting program with two invited keynote presentations; one by Dr. George Yu, CEO / Founder, Variable Inc, Chattanooga, TN and the other by Dr. Leonidas E. Ocolam, a Physicist from Argonne National Laboratory. We also have 12 oral presentations and approximately 30 poster presentations from users of the IEN shared-user laboratories.
Registration is FREE but space is limited due to the size capacity of the Marcus Building conference room. The registration for the full-day program will include, in addition to the research presentations, a poster session, continental breakfast, and a boxed lunch. Registrations will be processed on a "first-come-first-serve" basis, so please register as soon as possible to secure your space.
Please visit IENUserDay2014.eventbrite.com to register.
For more information, please contact Paul Joseph at firstname.lastname@example.org or (404) 894-5029.